Chapter 6.04

CPA Sputtering System

(cpa)

 

1.0          Title

CPA Sputtering System

2.0         Purpose

This document has specific operation and process information about the CPA 9900 Sputtering System.  It can RF sputter etch clean native oxide on substrates and sputter Ti, Al/ 2% Si, Ni and W films on both 4” and 6” wafers.

3.0         Scope

The CPA 9900 sputtering system has four targets for DC magnetron sputtering, an RF sputter etch station for pre-cleaning substrates of native oxide, and load-locked, heated end stations.

The targets currently available are:

 Ti               Location #1

 Al/2% Si    Location #2    99.999% Pure

 Ni              Location #3

 W              Location #4

These targets are labeled on the front of the system.  Dedicated pallets are provided for each metal film that will be sputtered.  They are stored in the storage unit below the right loading station and clearly labeled on front of the case door.  Do not mix pallets.  This will cause cross contamination issues.

The system has the ability to sputter targets sequentially. It is equipped with a 10-inch cryopump and has a base pressure of 2 x 10E-7 Torr. Substrates processed in this tool must be inorganic, low vapor pressure materials.

4.0         Applicable Documents

Revision History

5.0         Definitions and Process Terminology

6.0         Safety

6.1         Make sure pallets are all the way into the elevator before closing the load lock gate valve.

6.2         Turn on the water to a target before turning on the DC power to the target.

6.3         Turn off the ion gauge before opening the throttle valve (gas will flow with open throttle).

7.0         Statistical/Process Data

CPA statistical data are posted under the process monitoring section of the Microlab home page.

8.0         Available Process, Gases, Process Notes

Available Process

8.1         Four Targets are currently available for sputtering (Ti, Al/2%Si, Ni and W).

Process Notes

8.2         The CPA's linear design has three major sections; two load locks, end chambers, and a main process chamber. The CPA elevator (right load lock) can hold up to 9 pallets, at slots below the top dummy pallet.  Each pallet can hold nine 4" wafers or four 6” wafers.  The pallets may be loaded at either end of the system. Since there is not enough room to open the chamber door fully for load and unload pallets in the left L/L station, it is recommended to return the pallets to the right L/L station for loading and unloading.  An elevator in the load locks automatically loads the pallets onto a constant-speed conveyer which moves them from the load lock, the pallets moving through the main process chamber to the opposite load lock and automatically sputtering the wafers in the process. The conveyor or track may be reversed for multi-pass or sequential deposition.

8.3         Substrates processed in this tool must be inorganic, low vapor pressure materials in the standard mode of operation.

8.4         High vapor pressure materials, polymers, photoresist and organics maybe permitted in this tool, but only following process/application review and approval by Process Engineering Manager. Failure to do so could result in cryopump damage beyond repair, which means long CPA down time, and tens of thousands of dollars in cryopump replacement cost.

8.5         Kapton tape may be used in CPA with power setting, at or below 1000 W. Make sure to give enough delays for multiple passes to cool down the substrates, and never exceed the 1000 W power on any of the recipe setting/target material, while using Kapton tape.

8.6         Dedicated pallets are provided for each metal film. Please do not mix the pallets in the storage unit or during sputtering. Mixing pallets will cause cross contamination issues, hence, profoundly impact/destroy other members' device/products in the Microlab.  Moreover, cross-contaminated pallet cannot efficiently be cleaned by our metal etch/cleaner, and will have to be replaced at a cost.

9.0         Equipment Operation

9.1         Enable the system on the Wand. If you are going to use the aluminum target, enable cpa.

9.2         Operation of the system is automated when the AUTO MODE LED's are lit on the Left Load Lock (left L/L), Right Load Lock (right L/L), and the Main Chamber of the AUTOMATIC VACUUM CONTROLLER, located in the center of the system. Most members however, use the tool in manual mode (Auto/manual mode is flipped to manual) on the same panel. In either automatic or Manual mode of operation if any of the MAINT LEDs (maintenance LED's) or Alarm LED’s are lit, then DO NOT operate the system. Report the problem on the Wand.

9.3         Check the right side and left side L/L heaters (labeled 'SUBSTRATE TEMP CONTROLLER') to see if they are on (warm to the touch). Ask staff to turn them on, if they are not. Do not adjust the setting.

9.4         Vent the right L/L station as per follows:

9.4.1          Turn off the ion gauge.

9.4.2          Push the STANDBY button either over the right L/L, on the L/L Control panel, or by using the Automatic Vacuum Controller. This closes the L/L gate valve, isolating the chamber from the rest of the system.

9.4.3          Wait for the L/L gate valve to close -- you will hear a distinct clank when it does. This takes approximately 10-15 seconds.

9.4.4          Push the VENT button to bring the L/L chamber to atmosphere. If you vent too soon (while gate valve is open), you might raise the pressure of the chamber.

9.4.5          Unlatch the chamber door.

9.5         Check to make sure that an empty pallet is sitting in the top slot of the elevator assembly. It will catch any flakes falling from the top chain and protect the wafers on the pallets underneath from being contaminated.

9.6         By using the raise/lower switch above the L/L raise the elevator so it is near the top of the chamber. When you reach the top the upper limit LED (on the L/L Control panel) will light up.

9.7         Place your process wafers on a pallet(s) and slide it into a slot in the elevator; make sure it is level and in the center of the elevator. Check pallets again to insure they are level -- it is easy to misalign them. Manually (using the raise/lower switch) move the elevator down until the bottom pallet is ONE SPACE above the tracks (if not already there). Make sure to follow material compatibility/process rules noted in sections 8.3-8.5, before proceeding to the next step.

9.8         Close the L/L door and, while holding firmly, press the PUMP button on the L/L Control panel. Wait for the pump to kick in, and check that the L/L door is held firmly by the vacuum. The gate valve of the load station will automatically open and the system will cross over into hi-vac at ~200 mTorr.

9.9         When crossover into high vacuum is complete (you can hear the cryo kick in), you may turn on the ion gauge.

The following steps can be done while the system is pumping down (about 15 - 30 minutes):

9.10      The opposite L/L chamber must be prepared for receiving processed pallets. Lower the pallet elevator to the bottom position, enough to get the processed pallets in, by using the RAISE/LOWER switch to lower.

9.11      If you are going to use the AUTO MODE (most users run in MANUAL), set the pallet count (i.e., the number of pallets to be run), on the Automatic Pallet Transfer as follows:

9.11.1      Set the AUTO/MANUAL MODE in the center of the Automatic Pallet Transfer Controller switch to AUTO.

9.11.2      Push the COUNT UP button on the Right Station panel of the Pallet Controller, chamber pallets are in.

9.11.3      Toggle the COUNT SET/COUNT RESET switch on the Right Station panel to the COUNT SET side until the desired number of pallets is reached on the LED readout.

9.11.4      Press COUNT DOWN, the direction outgoing pallets are to index.

9.11.5      Toggle the COUNT SET/COUNT RESET switch on the receiving Left Station panel to COUNT RESET to zero the Pallet Count LEDs. Press the COUNT UP button, the direction for incoming pallet to index.

9.12      Set SPEED SELECT switch to VARIABLE.

9.13      Set the TRACK SPEED setting as necessary. You can use the following equation to get an idea of the speed you will need:

R = TS/WP          (R * WP) / T = TS    ( R * W /P ) / T = S   (see handwritten notes on next page)

where

 R = rate in A/min/Kw          A / min * kW

 T = film thickness in A

 W = width of target in cm (12.065 cm)

 S = track speed in cm/min.

 P = power in kW

The current process parameters and the Deposition Constant you need to determine the required track speed for a given thickness are listed in the header which appears when enabling the CPA, also updated at the Microlab process monitoring web site. The film thickness can be obtained by dividing the Constant by the track speed for the process condition. In addition to proper pre-sputter and good pressure, lowering the track speed will also improve film quality.

Below is an example of process parameters:

 Aluminum/2% Silicon

 Power:          4.5 kWatts

 Pressure:      6 mTorr

 Constant:      86,000 A*cm/min.

 Example: 16 cm/min. gives ~ 5100 A of Al/Si

 Note: The constant changes with target usage.

 Tungsten

 Power:          3.0 kWatts

 Pressure:      20 mTorr

 Constant:      30,000 A*cm/min.

 Example: 30 cm/min. gives ~1000 A of W

Note :   The constant changes with target usage.

Note :   The track speed is inversely proportional to the thickness, and the power is directly proportional to thickness. Keep track speed above 9 cm/min. Perform at least two passes to prevent substrate overheating and keep power out of the extreme upper and lower ends for consistent results.

9.14      Set TRACK TRAVEL DIRECTION to REVERSE (i.e., to the left).

9.15      Wait for the pressure to reach a minimum of 5 x 10E-7 Torr on the ion gauge readout.

Make sure that the target you want to sputter has been selected: targets 1 or 3 are selected by a toggle switch on the top power supply panel. Target #2 has its own supply.

9.16      Select High or Low process pressure via the pneumatic switch above the etch controller. Turn off the ion gauge and push the THROTTLE button on the Main Chamber section of the Automatic Vacuum Controller. This will turn on the process gas. Wait for the pressure to stabilize, 15 to 30 seconds.

9.17      Turn the GAS FLOW ADJUST knob, located below target #2, to set the Process Gas FLOW LED display. If your pressure needs are not met for a given gas flow, report it on the wand and have a staff member adjust the throttle valve for you. The throttle valve can be adjusted manually to any pressure.

9.18      Initiate cooling water to your target by using the rotating lever know on the right-hand side of the machine (as you’re facing the front of the machine). A green button will light up, showing that water is flowing, and only then will it allow you to turn on the DC power. If the DC power switch does not work, perhaps the machine is not enabled, or the cooling water flow is low.

Note:    If you do not turn on the target cooling water, you will not be able to strike a plasma! Adjust the power level by using the CONTROL knob. Observe plasma through viewport and make sure it looks stable. The color of the plasma is bluefish. For a good quality film, it is recommended that the target be pre-sputtered before use. Pre-sputter the target for 3-5 minutes. If a target has not been used for several weeks, it may be necessary to pre-sputter for a longer time period to remove any native oxides or contaminates.

Note:    If the target is arcing, it needs to be conditioned. Do not run the machine. Report the problem on the computer.

9.19      Push the green START button on the Automatic Pallet Transfer Controller to begin your process. When the pallet lowers down to the chain track, if placed incorrectly if may start rotating on the track, becoming stuck on the vertical rollers.

It will then be impossible to move it backwards or forwards. If your pallet does start to rotate on the track, immediately return to the load lock.* Open the L/L and check to make sure the pallet is not warped. Next, if the pallet is not warped, reposition it correctly.

To move things along more rapidly, you may leave the SPEED SELECT in the FIXED position (80 cm/min.) until your dummy pallet gets to the target and at that point switch it to the VARIABLE position to get the desired process track speed. Be sure to switch the speed BEFORE your wafers arrive at the target, about an inch from the deposition chamber, to insure a uniform metal layer. Pallets will move sequentially under the targets and end up in the left load lock.

9.20      Pallet removal may begin once all the pallets are in the L/L.

Note:    If you want to run another pass, proceed with a) below, reset per step 10 for opposite direction, push throttle, turn on P.S. and push start.

9.20.1      Turn off the power of the D.C. power supply and push the PUMP button on the Main Chamber section of the Automatic Vacuum Controller. This will turn off the process gas and open the high vacuum valve. To avoid breaking the gate valve by cranking the pallet, make sure that ALL the pallets are in the L/L, then stop the track by setting the TRACK TRAVEL DIRECTION switch to the center position.

9.20.2      Press STANDBY on the left End Station L/L Control panel or on the Automatic Vacuum Control panel. This will close the end station L/L valve.

9.20.3      WAIT until you hear the L/L gate valve close and press VENT to backfill the end station to atmosphere.

9.20.4      Unlatch end chamber door.

9.20.5      Remove pallets from end station from the bottom up to prevent particles from contaminating your samples.

9.20.6      Close door and latch.

9.20.7      Push PUMP while pressing FIRMLY on the L/L door to insure it is closed and check to see it seals properly. This will rough out the chamber and cross over to high vacuum automatically. To prevent debonding, make sure that you have run the cooling water at least 5 minutes after turning off power to your target.

9.21      When you are finished,

9.21.1      Turn on the ion gauge tube, to monitor machine pressure.

9.21.2      Make sure the RF sputter etch controller is left in MANUAL. This will disable it.

9.22      Disable the system and enter your process parameters and results in comments.

Note:    Every time the targets are changed and the chambers are exposed to air, the targets have to be reconditioned. This is done by a staff member.

Optional

RF Sputter Etch System Description

The sputter etch system consists of three control components: an ENI RF power supply located on the bottom right hand side of CPA, a RF matching/tuning box that sits on top of the sputter etch chamber, and the sputtering etch control panel located on the upper left hand side (on top of the ion gauge controller).

The front panel of the ENI RF power supply has three toggle switches, a power adjust dial, a power meter, and four led lights. The AC line toggle switch should always be on. The RF power toggle switch should be off/remote. One can toggle meter switch to either forward or reverse to monitor the forward or reflected RF power during sputtering etch. The power adjust dial is used for set RF power.

The RF matching/tuning box has three toggle switches and two meters. The auto/manual toggle switch should be on manual. Usually one need not adjust the tune and load, since they have been optimized at 42 and 78 respectively. The bias is not working.

The sputtering etch control panel can only run in manual mode (the toggle switch should be on manual). The position toggle switch is used to set sputtering target electrode position. The red RF ON and green RF OFF push buttons turn on/off the RF power. Other switches and push buttons are not used.

One important feature of the sputtering etch system requires all users' attention. That is the sputter electrode is made of copper. If there is a gap between the electrode and the pallet, and the plasma is on, the electrode will be sputtered too. The sputtered copper atoms will contaminate the whole chamber and the wafers inside. This situation usually occurs if one lowers the pallet position or switch to the auto mode on the sputtering etch control panel while the RF power is on.

RF Sputter Etch Operating Procedure

1.       Enable the system on the wand and load your wafers as per operating procedure defined in Section 2. Only one pallet of up to none wafers can be processed at any given time, although you can load more than one pallet into the load lock. Make sure that the pallets are not warped. It is a good idea to use an empty pallet first to check whether the system is working and to set the RF power.

2.       Check toggle switch settings and LEDs on all three control units.

ENI RF Power Supply:

 AC line:         on

 Meter:           forward

 RF Power:     off/remote.

 Only the AC on led should be on.

 RF Matching/Tuning Box:

 Manual mode

 Tune meter at 42

 Load meter at 78.

Sputtering Etch Control Panel:

 Manual mode

 Down led (red) on

 If position 1 or 2 led (green) are on, push the toggle switch to lower once.

3.       Set the track speed to the fixed speed (80 cm/min).

4.       Turn on the track in the reverse direction (to the left). This will turn the Track Fwd light on, on the Sputter Etch control panel.

5.       Next set Platform Position switch to position 1. (Lift switch once). This raises a stop for the pallet.

6.       Lower the pallet onto the moving track in the L/L. Run pallet out until it reaches the stop. Once it has stopped moving, stop the drive chain.

7.       Lift (raise) the switch again to raise the platform to position 2. Check to see if the pallet is positioned well on the electrode through the load lock window. Only two ends of the pallet can be seen. The center should be sitting inside the electrode.

If you can see the center edge of the pallet, return it to the load lock and resend it. If you still can see the center edge, the pallet may be misaligned or warped. Usually, you can not strike a plasma with this pallets. Even worse, if you strike a plasma, the electrode will be sputtered too. Unload the pallet and check it for warp. If it is bad, mark it then report on wand. Staff will handle the warped pallet.

8.       Turn off the ion gauge (filament).

9.       Press throttle valve switch to start gas flow.

10.   Adjust the gas flow to 7 mtorr. This should require a flow rate of ~200 sccm.

11.   Press RF ON switch (red). on the sputter etch control panel, not the toggle switch on the ENI RF power supply. Then check and set RF power using the dial on the ENI RF power supply. For our test we used 400 W (forward power). Check reverse power and make sure it is less than 60 W. Once power is on, etching progresses.

If there is no plasma, return the pallet to the load lock and repeat from step (2). If there is no plasma again, unload your wafers and report on the wand.

12.   When your desired sputter time is completed, press RF OFF button (green) on the sputter etch control panel to turn off power.

If the plasma cannot be turned off by the pushing RF OFF button, check the RF POWER toggle switch on the ENI RF power supply. If it is on, switch it to off/remote, then push the RF OFF button. If you still cannot turn off plasma, call staff immediately. Do not lower the pallets. Doing so will only contaminate your wafers and the whole chamber with copper.

13.   Toggle the platform position switch down once to lower the pallet to the normal position. Make sure to turn on the drive chain. You can then proceed with sputtering dep of your desired film or reverse the track direction to unload your wafers for a sputter only etch process.

Remember only one pallet should be sent through the machine at a time when using the Sputter Etch.

14.   Wafer unloading and equipment log off: You can also refer to operational procedure section for more detail explanation.

14.1      Turn off the Ar gas by hitting the pump button for the main chamber.

14.2      Once the gas has exited and pallet(s) are in the right L/L then the standby button can be pressed. This lowers a door that isolate the L/L..

14.3      Hit the vent button and release the door latch.

14.4      Remove wafers when door opens and return pallets to the designated slots in the storage unit.

14.5      Close the L/L door.

14.6      Turn on the Ion gauge (filament) and disable the machine.

 FBSputter Etch Process Example:

 Power:                      400 W

 Pressure:                  7 mT (200 Ar flow)

 Time:                        5 minutes

 Total wet oxide film removed

 (1000 A test wafers):  63 A

 Note:   This process gets the pallet quite hot; when the pallet was removed it was almost too hot to hold, so temp probably reached 100ºC.  Allow a few minutes to cool down before unloading it.

14      Troubleshooting Guidelines

15      Figures & Schematics

16      Appendix

*** Test run data for Al sputter etch on CPA ***

At 200 watts the etch rate of Al is ~12-13 Angstroms/min.

Pressure = 6 mTorr , Argon flow = ~50 sccm

This is slightly less than the rate for Al2O3 (sapphire), i.e.,15 A/min.

*** Low Power Titanium  (Ti) and Tungsten (W)  Deposition Recipes ***

Ti deposition:

Power  = 1.5 kW

Pressure = 7 mT

Track speed = 30 cm/min

Dep rate ~ 600 A/pass

W Deposition Recipe:

Power = 2.0 kW

Pressure = 10 mT

Track speed = 35 cm/min

Dep rate ~ 1000 A/pass

Target Inventory:

 AlSi (99.999% pure), Ti, W (99.999% pure)

CPA Study Guide

 

 Be sure to know:

1.       Which materials are NOT allowed in cpa

2.       Maintenance LEDs

3.       Pre-Start-up checks

4.       Ion gauge when it should be on or off

5.       Venting the load-lock

6.       How to obtain process parameters for Al deposition

7.       Base pressure

8.       Throttle

9.       Using the viewport

10.   Track speed

11.   Loading and unloading pallets.

12.   Troubleshooting problem pallets.

13.   Target pre-sputtering.

14.   Setting the target.

15.   Typical film quality problems and troubleshooting them.

16.   DC power supply, and cooling water.

17.   What plasma is; how it is used.