Chapter 6.07

Edwards Auto 306 DC and RF Sputter Coater

(edwards)

1.0         Title

Auto 306 DC and RF Sputter Coater

2.0         Purpose

The Edwards system sputters metal and dielectric materials

3.0         Scope

Films are deposited by bombarding the target material with high-energy ions from a plasma. The films deposited by this method are uniform in thickness and capable of covering areas usually shadowed by other deposition methods.

The Edwards system consists of two parts:

     Deposition chamber, vacuum system and control panel

     DC and RF power supplies and MFC control panel

Inside the deposition chamber are two magnetron guns (DC on right, RF on left, a substrate holder (6-inch standard, with 4-inch adapter plates), a thermocouple and a substrate heater.  Maximum temperature for the substrate heater is 250ºC. Do not exceed this value. The control panel controls the vacuum, the rotation of the substrate holder and heating of the substrate.  One mechanical pump is installed for rough pumping and one turbo pump for fine pumping.  A crystal monitor is installed in the system but not currently configured for use.

A DC and RF power supply provides the power needed to generate plasma in the deposition chamber.

4.0         Applicable Documents

Revision History

Description of a basic vacuum system:

                           http://microlab.berkeley.edu/text/labmanual/chap6/vacuum.pdf

Vendor manuals: Edwards Auto 306 DC and RF Sputter Coater.  Auto 306 Accessories: Plasmaglo, DC Sputtering, Single Bar Glow Discharge, Gold Plated Target, SEM Specimen holder and Auto Gas Bleed Kit.  Auto 306 Accessories: Workholder and Heater Accessories.  Auto 306 Accessories: Rotary Workholder.  Advanced Energy MDX 1.5K Magnetron Drive.  Advanced Energy MDX 1.5K.  VM 700-1000-1500 Instruction Manual. 

Vendor materials on web: http://www.bocedwards.com/pdf/planar.pdf, http://www.bocedwards.com/pdf/CoatingSystems_Components.pdf, http://www.bocedwards.com/pdf/auto306em.pdf 

5.0         Definitions & Process Terminology

5.1         Deposition Chamber: Contains DC and RF magnetrons, wafer holder, crystal monitor (not installed yet) and heat lamp. The door has a magnetic bearing and users should gently close the door without adding forces on it to assure good seal of the chamber.

5.2         Control Panel: Allows you to vent and pump the chamber.

5.3         DC Power Supply: Middle of the equipment rack to left of deposition chamber. OFF unless process interlock on.

5.4         RF Power Supply: Bottom of the equipment rack to left of deposition chamber. OFF unless process interlock on.

5.5         Workholder Control: Controls the rotation of the wafers.

5.6         Crystal Monitor (not yet configured): Monitors the evaporation rate by correlating deposited metal thickness to the amount of deviation from its original crystal resonant frequency.

5.7          Sputtering Materials: Targets available from Microlab: Ag, Al, Co, Cr, Cu, In, ITO (90/10%), Ni, Pd, SiO2, Ti, W. Members may supply their own targets for use in this system after getting permission by e-mailing edwards at silicon.eecs.berkeley.edu and requesting a new sputter material. Gold, palladium, platinum and other precious metal targets will no longer be stocked by the Microlab after the current inventory is exhausted. 

5.8     Target: Diameter: 7.5 cm.  Standard thickness: 6 mm.  Can order from Super Conductor Materials, Inc. Dielectric materials and poor thermal conductors should be ordered indium-bonded to a 1/16” (~1.5 mm) copper backing plate.

6.0         Safety

6.1         Read all relevant instructions before you operate any accessories.

6.2         Surfaces within the AUTO 306 may hot. Do not touch surfaces without cooling first.

6.3         Intense light will be emitted from the plasma.

6.4         Observe all safety precautions when you come into contact with dangerous substances which have been used with the evaporation materials.

6.5         Wear clean lint-free gloves when you handle components in the chamber to prevent contamination of the evaporation materials and its accessories.

6.6         Do not add extra forces when you close the chamber door. It will damage the magnetic bearing.

6.7         Metal dust is a hazard.  Never use compressed gas to clean the chamber.  A house vacuum drop is available to the right of the chamber.

7.0         Statistical/Process Data

The following recipes (parameter settings/dep rates) provided by Hellman group (Physics) can be used to sputter different films in the Edwards machine (see Tables below (data dated 10/17/06). Please note, all these recipes use power settings below the cut off limit (350W <), defined by staff for this tool.

7.1         Standard Processes

Material

Magnetron Gun Type

Power (W)

Pressure (MTorr)

Rate (A/min)

Cr

RF

100

6.5

38

Ti

RF

100

5

20

Al

DC

300

5

182

Cu

DC

300

5

248

Au

DC

200

5.5

277

Pt

DC

300

5

198

7.2         Low Film Stress Processes

Material

Magnetron Gun Type

Power W)

Pressure (MTorr)

Rate (A/min)

Film Stress

Pt

DC

300

8

200

16.5 MPa, tensile

Cu

DC

100

2

106

218 MPa, compressive

Cr

DC

300

0.4

189

53.4 MPa,tensile

8.0         Available Process, Gases, Process Notes

Pumping Speed: < 10 min. to reach process pressure.

Available Targets: Al, Cr, Cu, ITO, Ni, SiO2, Ti, W, Ag, Pd, Co

Precious metal targets, such as gold and platinum are not stored by the edwards. Precious metal targets are available for checkout from the Microlab office.

Maximum power for the Edwards for any bonded target is 350W.

 Note:   For the Edwards 3” magnetron guns this power setting corresponds to a power density of ~50 W/in2. Power density greater than 50 W/in2 results in excessive heating of the target. If the target becomes too hot, it may crack due to thermal stress or it may delaminate due to softening of the solder material used to bond the target to its backing plate.

Labmembers are cautioned against comparing the RF or DC power setting of a specific tool in the MIcrolab to the power setting published in some reference for some other tool. Most references do not provide any critical tool geometry information (target size and distance from source). Power density - not the absolute setting of the power supply - is the significant variable for determining deposition rate. For example, on the Randex (another general use sputter tool in the Microlab) the target size is 5” diameter, and the maximum allowable power is 1000 W – which also corresponds to a target power density of ~50 W/in2.  

Note:    Lab members  can use process conditions noted in section 7.0, as a good starting point for their own process.

9.0         Operating Procedure

9.1         Enable edwards on WAND.

9.2         Check that the cooling system and cabinet interlock are on.  Report fault if not.  The vacuum interlock should also be on if the system was properly left in standby mode and pumped down by the previous user.

9.3         Vent the chamber (press seal and then vent).  The vacuum interlock will turn off shortly after the system output reads atmospheric pressure.  It will take a little longer for the chamber to be able to be opened.

9.4         Place targets in the RF (front left) or DC (back right) magnetrons.

Note:  DO NOT TOUCH THE TARGET WHEN IT IS HOT, IMMEDIATELY AFTER PROCESSING WAFER/S. THIS CAN RESULT IN INJURY AND/OR TARGET CONTAMINATION (SURGICAL GLOVES CAN EASILY MELT ONTO THE TARGET SURFACE).

9.4.1          Open the shutter for the appropriate magnetron.  A manual lever on the left hand side of the chamber operates the RF shutter and the control unit to the right of the chamber operates the DC shutter (SS1 button). 

9.4.2          Lift off the target shield cylinder surrounding the magnetron.  Care should be taken to not hit the inside of the chamber as this is being done.  The workholder may need to be rotated to remove the cylinder from the chamber. 

9.4.3          Unscrew the copper ring on top of the target and place the target in the center of the top surface.  Use caution when placing magnetic targets onto the sputter gun.  There are strong magnets in the gun that will attract the target and this is a pinch hazard.  Place the copper ring back in place and screw it down in a diagonal/star pattern - a metric Allen wrench is provided and should stay with the machine at all times. 

9.4.4          A pad is also provided to clean off any surfaces that have materials from previous runs flaking off.  This should also remain with the machine at all times.  Inspect the target clamp and shield for excessive material build up.  Report a fault if either needs a thorough cleaning.

9.4.5          Place the cylinder back around the magnetron.  If you have the standard target thickness of 6mm, the smallest slot should be used for the RF target shield and the middle slot should be used for the DC target shield.  A standard 6 mm thick target will have 5 mm spacing for the shield for RF sputtering and will have 3 mm spacing for DC sputtering.  If your target is a different thickness consult the Edwards Auto 306 DC and RF Sputter Coater manual in the Microlab office.  Magnetic materials need to be much thinner (1-2 mm) and should use a Cu backing plate to obtain the overall desired thickness. 

9.4.6          Close the shutters once the target is in place. If a target is not being used, the cover should remain over the shield.

9.5         Once the target is in place, check to make sure that the wafer holder can rotate freely - the thermocouple needs to clear the rotating holder and can easily be moved when changing the target. Place the wafers in the substrate holder, using the 4-inch wafer converters if necessary.

9.6         If the small cylinder vacuum cap in the front right of the chamber has popped off, replace it in the correct position.

9.7         Close the chamber door and press CYCLE to evacuate the chamber.  Pressing cycle evacuates the chamber without enabling the process interlock.

9.8         When the vacuum is sufficient to begin the sputter process, the PROCESS button will light up on the vacuum control panel.  Press PROCESS to begin the sputter process.  Once the process interlock is enabled, the gas flow controller and the DC and RF power supplies are enabled.  Start flow of the Ar/N/O2 gases depending on process parameters.

9.9         Mass Flow Controller (MFC)

9.9.1          Enable Gas 1 (AR) or Gas 2 (O2) by toggling the pneumatic toggle switches just above the Brooks Controller.  The Left toggle switch is for Argon and the Right toggle switch is for Oxygen/Nitrogen.  This opens the pneumatic valves only.  Either Nitrogen or Oxygen may be selected by turning the valve below the vacuum control panel.\

9.9.2          Set MFC flow at front panel of the Brooks controller.  Press the “Channel Selection” Key until you see “>” symbol after 1 or 2, i.e. “1>” = Gas 1 is Active channel.

9.9.3          Set the desired flow by pressing the “Up” or “Down” arrow keys to your desired flow setting.  The double up arrows increments by 1’s and the single up arrow button increments by .05.

9.9.4          Press “Enter” (the set-point will not be entered until you press enter).

9.9.5          The controller display will automatically cycle back to flow reading within a few seconds.  You should see gas flow at this time.  You must be in “Process” mode on the Edwards for gas flow.

Note:    PLEASE DO NOT ADJUST ANY OTHER VALUES OTHER THAN GAS SETPOINTS ON THE BROOKS CONTROLLER.

9.10      Adjust settings for appropriate power supply.  Please see applicable documents in Section 4.0 if process parameters are not already known for your material or consult superuser/Microlab staff.  Process data will be supplied in this document once materials have been evaluated.

9.11      DC Sputtering – AE MDX-1.5K

9.11.1      Press setpoint and adjust the set point using the level knob.

9.11.2      Press actual until watts are shown. Do not exceed 350 Watts for unbacked metal targets. Targets attached to a backing plate should be limited to 300 Watts or less.

9.11.3      Do not adjust RAMP – the knob should be locked.

9.11.4      Turn on the power supply and look for plasma – color will depend on material being sputtered.

9.12      RF Sputtering – AE RFX-600

9.12.1      Hold down SETPOINT while adjusting the LEVEL knob to set the sputter power.  Do not exceed 350 Watts for metal targets. Dielectric targets and targets attached to a backing plate should be limited to 300 Watts or less. Use caution with power settings for thermally sensitive materials.

9.12.2      Make sure that the auto-tuner is set to AUTO.

9.12.3      Turn on the power supply and look for plasma – color will depend on material being sputtered. 

9.12.4      Tips for igniting the RF plasma

9.12.4.1       Set the Ar pressure to ~20 mTorr and turn on the power supply.  When the plasma ignites the Ar pressure can reduced to the desired pressure.

9.12.4.2       Start with a metal target in the DC gun and ignite the plasma.   (The shutter does not need to be opened.)  Turn on the RF power supply.  The DC power supply may be turned off once the RF plasma has ignited.

9.13      Start rotating the wafers.  Open shutter and start deposition time.

9.14      Once done sputtering, close the shutter, turn off power supply, and then stop the wafer rotation.  Set the MFC to zero flow and press CYCLE to evacuate the process gas from the chamber.  If the process interlock turns off while sputtering, you will need to extend the time delay for the interlock.  See the troubleshooting Section 10.1 for more information.

9.15      Press SEAL and then VENT if the process interlock is still enabled.  If the time delay set point has passed and the process interlock is disabled and only VENT needs to be pressed.  Make sure that the chamber has sufficient time to cool down before venting.

9.16      Wait for the chamber to come up to atmospheric pressure and remove wafers from the holder.  System may be hot inside deposition chamber if sputtering times were long.

9.17      Repeat from 9.5 if additional wafers need to be processed.  Otherwise proceed to 9.18.

9.18      Open appropriate shutters and remove target(s).  Replace ALL covers and close the shutters.  Replace vacuum cap.  Targets should be returned to their appropriate storage container and never be left in the chamber.

9.19      Once all wafers and targets have been removed, close the chamber door and evacuate the system by pressing CYCLE.

9.20      Once the system is pumped down, disable the equipment on wand and provide the following information in the comment section: material sputtered, gas type and flow rates, DC or RF power, and deposition time (for desired thickness if known).  If a previous user had left a target in the system, please make a note.

10.0      Troubleshooting Guidelines

10.1      Process interlock shuts off. If the time delay set point is too short and the process interlock disables before you are done sputtering, you can adjust the time by going into the set point-relay menu.

10.1.1      Press NO for main menu, scroll to set point-relay and press YES.

10.1.2      Scroll to time delays and press YES.

10.1.3      Scroll to time delay 7 (if not already there).

10.1.4      To adjust time, press yes and a blinking B should be seen.  Using arrow keys, set the first digit of the desired time and press yes.  Set the second digit and press YES or press YES again (while B is still blinking) to go the minute/second display.  Set to minutes (M) or seconds (S) and press YES to set new time.

10.1.5      Once the new time is set, press NO to exit menus until you reach the main menu.  Select Process Sequence and press YES to go back to the normal screen.

10.2      Gases are not flowing.  If all the appropriate switches are open and no gas is flowing check to make sure edwards is enabled.

10.3      VOLTS ERR is displayed on the vacuum control panel.  This error is displayed when the high vacuum (Penning) gauge has a flake in it.  The vacuum controller will not let you enter the process mode if this condition exists.  File a fault on the wand to have the gauge cleaned by the process staff.

11.0      Figures & Schematics

Figure 1 - DC and RF Sputter Coater

 

Figure 2

 

Figure 3

 

Figure 4

 

Figure 5

 

Figure 6

 

Figure 7

 

Figure 8

 

Figure 9